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2SC5714
TOSHIBA Transistor Silicon NPN Epitaxial Type
2SC5714
High-Speed Switching Applications DC-DC Converter Applications Strobe Applications
* * * High DC current gain: hFE = 400 to 1000 (IC = 0.5 A) Low collector-emitter saturation voltage: VCE (sat) = 0.15 V (max) High-speed switching: tf = 90 ns (typ.) Industrial Applications Unit: mm
Maximum Ratings (Ta = 25C)
Characteristics Collector-base voltage Collector-emitter voltage Collector-emitter voltage Emitter-base voltage Collector current Base current Collector power dissipation Junction temperature Storage temperature range DC t = 10 s DC Pulse Symbol VCBO VCEX VCEO VEBO IC ICP IB PC (Note) Tj Tstg Rating 40 30 20 7 4 7 400 1.0 2.5 150 -55 to 150 Unit V V V V A mA W C C
JEDEC JEITA TOSHIBA
SC-62 2-5K1A
Weight: 0.05 g (typ.)
Note: Mounted on FR4 board (glass epoxy, 1.6 mm thick, Cu area: 2 645 mm )
Electrical Characteristics (Ta = 25C)
Characteristics Collector cut-off current Emitter cut-off current Collector-emitter breakdown voltage DC current gain Collector-emitter saturation voltage Base-emitter saturation voltage Collector output capacitance Rise time Switching time Storage time Fall time Symbol ICBO IEBO V (BR) CEO hFE (1) hFE (2) VCE (sat) VBE (sat) Cob tr tstg tf Test Condition VCB = 40 V, IE = 0 VEB = 7 V, IC = 0 IC = 10 mA, IB = 0 VCE = 2 V, IC = 0.5 A VCE = 2 V, IC = 1.6 A IC = 1.6 A, IB = 32 mA IC = 1.6 A, IB = 32 mA VCB = 10 V, IE = 0, f = 1 MHz See Figure 1 circuit diagram. VCC ~ 12 V, RL = 7.5 W IB1 = -IB2 = 53.3 mA Min 3/4 3/4 20 400 200 3/4 3/4 3/4 3/4 3/4 3/4 Typ. 3/4 3/4 3/4 3/4 3/4 3/4 3/4 18 100 350 90 Max 100 100 3/4 1000 3/4 0.15 1.10 3/4 3/4 3/4 3/4 ns V V pF Unit nA nA V
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2001-12-17
2SC5714
Marking
VCC 20 ms IB1 IB1 RL
2E
Output
Input IB2
IB2 Duty cycle < 1%
Figure 1
Switching Time Test Circuit & Timing Chart
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2001-12-17
2SC5714
IC - VCE
6 Common emitter Ta = 25C Single nonrepetitive pulse 1000 25 60 50 40 30 20 3 10 2 5 -55
hFE - IC
Ta = 100C
5
(A)
IC
4
Collector current
DC current gain
hFE
100
1 IB = 2 mA 0 0 0.1 0.2 0.3 0.4 0.5
Common emitter VCE = 2 V Single nonrepetitive pulse 10 0.001 0.01 0.1 1 10
Collector-emitter voltage VCE
(V)
Collector current
IC
(A)
VCE (sat) - IC
1
VBE (sat) - IC
10
Collector-emitter saturation voltage VCE (sat) (V)
0.1 Ta = 100C -55C 0.01 25C
Base-emitter saturation voltage VBE (sat) (V)
Common emitter IC/IB = 50 Single nonrepetitive pulse
Common emitter IC/IB = 50 Single nonrepetitive pulse
1
-55 25
Ta = 100C
0.001 0.001
0.01
0.1
1
10
0.1 0.001
0.01
0.1
1
10
Collector current
IC
(A)
Collector current
IC
(A)
IC - VBE
6 Common emitter VCE = 2 V Single nonrepetitive pulse Ta = 100C 25 -55
5
(A)
Collector current
IC
4
3
2
1
0 0
0.2
0.4
0.6
0.8
1
1.2
Base-emitter voltage VBE
(V)
3
2001-12-17
2SC5714
Transient Thermal Resistance rth - tw
1000
Transient thermal resistance rth (C/W)
100
10 Curves should be applied in thermal limited area. Single nonrepetitive pulse 645 mm2) 1 0.001 0.01 0.1 1 10 100 1000 Ta = 25C Mounted on FR4 board (glass epoxy, 1.6 mm thick, Cu area:
Pulse width
tw
(s)
Safe Operating Area
10 IC max (pulsed) IC max (continuous) 10 ms 100 ms 1 ms 10 ms 100 ms* -10 s*
(A)
Collector current
IC
1
DC operation * (Ta = 25C)
: Single nonrepetitive pulse Ta = 25C 0.1 Note that the curves for 100 ms*, 10 s* and DC operation* will be different when the devices aren't mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area: 2 645 mm ). These characteristic curves must be derated linearly with increase in temperature. 0.01 0.1 1 10
VCEO max
100
Collector-emitter voltage VCE
(V)
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2001-12-17
2SC5714
RESTRICTIONS ON PRODUCT USE
000707EAA
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others.
* The information contained herein is subject to change without notice.
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2001-12-17

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